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WEBINARS Presented by: nikonmetrology.com Date and Time: November 12, 2015 2:00 PM EST Presenters Mike Wolfe District Sales Manager, Nikon Metrology, Inc. REGISTER TODAY: Registration Link: http://short.gardnerweb.com/Nikon Sign up for Automotive Design & Production webinars. You will get one-on-one product information, process insight and direct contact with suppliers ofering the most current machining technology. Explore the "Smaller World" of the Automotive Industry with the JCM-6000 Plus SEM In the world of manufacturing today it seems as though everything is getting smaller and smaller. This presents a challenge for companies to not only produce but also inspect components at a microscopic level. For many years, metalworking and auto- motive companies have used traditional microscopes for inspection; however these microscopes are often limited by their resolution and depth of feld. Companies are fnding themselves turning to scanning electron microscopes to meet these demand- ing requirements. Join us on Thursday, November 12th, for an exclusive webinar featuring the new NeoScope JCM-6000 Plus Benchtop SEM from JEOL. Nikon Metrology's SEM Sales Specialist, Mike Wolfe, along with JEOL's Senior Applications Engineer / Assistant Director, Donna Guarrera will provide a presentation of this exciting product. This compact, easy to use and afordable instrument can help broaden your company's inspection capability and provide a distinct advantage in today's competitive market. Don't miss this opportunity. Sign up today! Primary Topics: • The basics of SEM for inspection, quality control, metallography, and failure analysis in the metalworking and automotive industries • The use of an SEM for Research and Development • Advantages of the benchtop SEM • Advances with the new JCM-6000 Plus and how these can help metalworking and automotive companies' inspection processes. Presenters' Bio: Mike Wolfe is the Northeast Region District Sales Manager for Nikon Metrology in- dustrial products and Product Specialist for the NeoScope benchtop SEM from JEOL. Mike's responsibilities include meeting with potential customers to better understand their inspection requirements and advising them on how to incorporate Nikon Metrol- ogy's Products into their inspection process. Mike has 20 years of service with Nikon and over 25 years of experience in the industrial inspection feld. Donna Guarrera is the Assistant Division Director, SM Division for JEOL USA, Inc. Prior to joining JEOL in 2002, she spent over 15 years as an Analytical and Research Chemist with extensive experience in R&D;, product development and manufacturing across a broad range of industries. Donna currently manages the SEM product line including the NeoScope for JEOL USA, Inc. Donna Guarrera Assistant Division Director, SM Division of JEOL USA, Inc.